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An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits
Zhang, Guoyan; Farrell, Ronan
Built-In-Test (BIT) for Radio Frequency Integrated Circuits (RFIC) is an effective method to reduce the testing cost, especially with the increase of integration level and operating frequency. In this work, a fully integrated CMOS BIT methodology is proposed. The BIT circuit used is rectifierbased and gate-source connected MOS transistor with Substrate Positively-Biased (SPB) scheme is used to further improve the detecting sensitivity. With little current consumption, high input impedance and high frequency scalability this circuit can predict complex high frequency performances of RF circuits such as gain, operating frequency, bandwidth and linearity. Besides, the influence of Process, supply Voltage, and Temperature (PVT) variations on the performance of RF circuits can also be monitored by using this BIT circuit.
Keyword(s): Electronic Engineering; Radio Frequency Integrated Circuits; CMOS RF circuits; built-in self test; CMOS integrated circuits; integrated circuit testing; radiofrequency integrated circuits; rectifiers
Publication Date:
Type: Book chapter
Peer-Reviewed: Yes
Institution: Maynooth University
Citation(s): Zhang, Guoyan and Farrell, Ronan (2007) An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits. In: 2006 13th IEEE International Conference on Electronics, Circuits and Systems. IEEE, pp. 612-615. ISBN 1424403944
Publisher(s): IEEE
File Format(s): application/pdf
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First Indexed: 2014-09-21 05:17:03 Last Updated: 2018-07-13 06:15:56