Institutions | About Us | Help | Gaeilge
rian logo

Go Back
Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits
Zhang, Guoyan; Farrell, Ronan
An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the RF output signal into DC signal. In this BIT circuit, low threshold voltage MOS transistor with positive substrate bias is used to act as diode to further improve the conversion efficiency and the detecting sensitivity. With this BIT circuit, the minimum input testing sensitivity can be improved to -50dBm. Also, this circuit doesn't consume current and has very high operating frequency scalability. As an example 2.4GHz low noise amplifier by using this BIT detecting circuit has been verified, and gain and linearity information can be obtained without influencing the performance of the attached RF circuits.
Keyword(s): Electronic Engineering; BIT; Rectifier-based; RF; built-in self test; integrated circuit testing; low-power electronics; MOS integrated circuits; radiofrequency integrated circuits; rectifying circuits
Publication Date:
Type: Book chapter
Peer-Reviewed: Yes
Institution: Maynooth University
Citation(s): Zhang, Guoyan and Farrell, Ronan (2006) Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits. In: 2006 IEEE Design and Diagnostics of Electronic Circuits and systems. IEEE, pp. 87-88. ISBN 1424401852
Publisher(s): IEEE
File Format(s): application/pdf
Related Link(s):
First Indexed: 2014-09-21 05:17:04 Last Updated: 2018-07-13 06:15:56