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Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy
Manzo, Michele; Denning, Denise; Rodriguez, Brian J.; Gallo, Katia
We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d 33 coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO3 value, for undoped and 5 mol. % MgO-doped substrates, respectively. Science Foundation Ireland COST action MP0702 Swedish Research Council ADOPT Linnaeus Centre for Advanced Optics and Photonics, Stockholm
Keyword(s): Atomic force microscopy; Polarisation; Protons; Refractive index; Ferroelectric substrates
Publication Date:
2014
Type: Journal article
Peer-Reviewed: Unknown
Language(s): English
Institution: University College Dublin
Publisher(s): American Institute of Physics
First Indexed: 2014-09-25 05:32:21 Last Updated: 2018-10-11 15:27:30