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Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes
Jackson, Jennifer C.; Hurley, Paul K.; Lane, Bill; Mathewson, Alan; Morrison, Alan P.
This letter presents an experimental study of dark count rates and leakage current in Geiger-mode avalanche photodiodes (GM APD). Experimental results from circular diodes over a range of areas (20-500 mum diam), exhibit leakage current levels orders of magnitude higher than anticipated from dark count rates. Measurements of the area and peripheral components of the leakage current indicate that the majority of the current in reverse bias does not enter the high-field region of the diode, and therefore, does not contribute to the dark count rate. Extraction of the area leakage current term from large-area devices (500 mum) corresponds well with the measured dark count rates on smaller devices (20 mum). Finally, the work indicates how dark count measurements represent 10(-18) A levels of leakage current detection in GM APDs. (C) 2002 American Institute of Physics. (DOI: 10.1063/1.1483119)
Keyword(s): Accurate extraction; Junction; Leakage currents; Avalanche photodiodes; Electric measurements
Publication Date:
2002
Type: Journal article
Peer-Reviewed: Yes
Language(s): English
Institution: University College Cork
Citation(s): Jackson, J. C., Hurley, P. K., Lane, B., Mathewson, A. and Morrison, A. P. (2002) 'Comparing leakage currents and dark count rates in Geiger-mode avalanche photodiodes', Applied Physics Letters, 80(22), pp. 4100-4102. doi: 10.1063/1.1483119
Publisher(s): AIP Publishing
File Format(s): application/pdf
Related Link(s): http://aip.scitation.org/doi/abs/10.1063/1.1483119
First Indexed: 2017-09-06 06:39:39 Last Updated: 2017-09-06 06:39:39