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High resolution imaging with differential infrared absorption micro-spectroscopy
Pita, Isabel A.; Hendaoui, Nordine; Liu, Ning; Kumbham, Mahendar; Tofail, Syed A.M.; Peremans, André; Silien, Christophe
Although confocal infrared (IR) absorption micro-spectroscopy is well established for far-field chemical imaging, its scope remains restricted since diffraction limits the spatial resolution to values a little above half the radiation wavelength. Yet, the successful implementations of below-the-diffraction limit far-field fluorescence microscopies using saturated irradiation patterns for example for stimulated-emission depletion and saturated structured-illumination suggest the possibility of using a similar optical patterning strategy for infrared absorption mapping at high resolution. Simulations are used to show that the simple mapping of the difference in transmitted/reflected IR energy between a saturated vortex-shaped beam and a Gaussian reference with a confocal microscope affords the generation of high-resolution vibrational absorption images. On the basis of experimentally relevant parameters, the simulations of the differential absorption scheme reveal a spatial resolution better than a tenth of the wavelength for incident energies about a decade above the saturation threshold. The saturated structured illumination concepts are thus expected to be compatible with the establishment of point-like point-spread functions for measuring the absorbance of samples with a scanning confocal microscope recording the differential transmission/reflection. (C) 2013 Optical Society of America PUBLISHED peer-reviewed
Keyword(s): structured-illumination microscopy; raman-scattering microscopy; theoretically unlimited resolution; depletion fluorescence microscopy; optical reconstruction microscopy; vibrational-energy relaxation; ground-state-depletion; synchrotron-radiation; confocal microscopy; diffraction-limit
Publication Date:
Type: Journal article
Peer-Reviewed: Yes
Language(s): English
Institution: University of Limerick
Funder(s): Higher Education Authority
Citation(s): 280804
Optics Express;21 (22), pp. 25632-25642
Publisher(s): Optical Society of America
First Indexed: 2014-07-17 05:35:07 Last Updated: 2018-12-02 06:43:42